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Cremades Rodríguez, Ana Isabel and Albrecht, M. and Voigt, A. and Krinke, J. and Dimitrov, R. and Ambacher, O. and Stutzmann, M. (1998) Minority carrier diffusion length in AlGaN: A combined electron beam induced current and transmission microscopy. Solid State Phenomena, 63-4 . pp. 139-146. ISSN 1012-0394

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