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Number of items: 8.

Ramos, Pablo and Vargas, Vanessa and Baylac, Maud and Villa, Francesca and Rey, Solenne and Clemente, Juan Antonio and Zergainoh, Nacer-Eddine and Méhaut, Jean-François and Velazco, Raoul (2016) Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2193-2200. ISSN 0018-9499 (In Press)

Ramos, Pablo and Vargas Vallejo, Vanessa Carolina and Baylac, Maud and Villa, Francesca and Rey, Solenne and Clemente Barreira, Juan Antonio and Zergainoh, Nacer-Eddine and Méhaut, Jean-François (2016) Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2193-2200. ISSN 0018-9499

Velazco, Raoul and Clemente Barreira, Juan Antonio and Hubert, Guillaume and Mansour, Wassim and Palomar Trives, Carlos and Franco Peláez, Francisco Javier and Baylac, Maud and Rey, Solenne and Rosetto, Olivier and Villa, Francesca (2014) Evidence of the robustness of a COTS soft-error free SRAM to neutron radiation. IEEE transactions on nuclear science, 61 (6). pp. 3103-3108. ISSN 0018-9499

Clemente, Juan Antonio and Hubert, Guilaume and Fraire, Juan and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Solenne and Baylac, Maud and Puchner, Helmut and Mecha, Hortensia and Velazco, Raoul (2018) SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2 MeV Neutrons. IEEE transactions on nuclear science (99). pp. 1-8. ISSN 0018-9499 (In Press)

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Ramos Vargas, Pablo Francisco and Vargas Vallejo, Vanessa Carolina and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Velazco, Raoul (2016) Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2072-2079. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Rey, Solenne and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2016) Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs. IEEE Transactions on Nuclear Science, 63 (4). pp. 2087-2094. ISSN 0018-9499

Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Baylac, Maud and Rey, Solenne and Villa, Francesca and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2017) Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs. IEEE Transactions on Nuclear Science, 64 (8). pp. 2152-2160. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Sole and Baylac, Maud and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2015) Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 507-510. ISBN 978-1-5090-0232-0

This list was generated on Sun Nov 17 04:41:44 2019 CET.