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Number of items: 15.

Franco Peláez, Francisco Javier and Velazco, Raoul (2007) A portable low-cost SEU evaluation board for SRAMs. In 2007 Spanish Conference on Electron Devices, Proceedings. IEEE-Inst Electrical Electronics Engineers Inc, pp. 165-168. ISBN 1-4244-0868-7

Velazco, Raoul (2013) Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y tests experimentales. In Ciclo de conferencias del Máster en Investigación en Informática, 18 de junio de 2013, Sala de Grados de la Facultad de Informática de la Universidad Complutense de Madrid. (Submitted)

Ramos, Pablo and Vargas, Vanessa and Baylac, Maud and Villa, Francesca and Rey, Solenne and Clemente, Juan Antonio and Zergainoh, Nacer-Eddine and Méhaut, Jean-François and Velazco, Raoul (2016) Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2193-2200. ISSN 0018-9499 (In Press)

Velazco, Raoul and Clemente Barreira, Juan Antonio and Hubert, Guillaume and Mansour, Wassim and Palomar Trives, Carlos and Franco Peláez, Francisco Javier and Baylac, Maud and Rey, Solenne and Rosetto, Olivier and Villa, Francesca (2014) Evidence of the robustness of a COTS soft-error free SRAM to neutron radiation. IEEE transactions on nuclear science, 61 (6). pp. 3103-3108. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Mansour, Wassim and Ayoubi, Rafic and Serrano, Felipe and Mecha López, Hortensia and Ziade, Haissam and El Falou, Wassim and Velazco, Raoul (2016) Hardware Implementation of a Fault-Tolerant Hopfield Neural Network on FPGAs. Neurocomputing, 171 . pp. 1606-1609. ISSN 0925-2312

Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Mecha López, Hortensia and Velazco, Raoul (2019) Influence of Randomness during the Interpretation of Results from Single-Event Experiments on SRAMs. IEEE Transactions on device and materials reliability, 19 (1). pp. 104-111. ISSN 1530-4388

Velazco, Raoul (2014) Inyección de fallos para el análisis de la sensibilidad a los errores transitorios, “soft errors”, provocados por las radiaciones en circuitos integrados. In Ciclo de Conferencias de la Facultad de Informática, 21 de mayo de 2014, Sala de Grados de la Facultad de Informática de la Universidad Complutense de Madrid. (Submitted)

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Vila, Francesca and Baylac, Maud and Ramos Vargas, Pablo Francisco and Vargas Vallejo, Vanessa Carolina and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Velazco, Raoul (2015) Neutron-Induced single events in a COTS soft-error free SRAM at low bias voltage. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 162-165. ISBN 978-1-5090-0232-0

Clemente, Juan Antonio and Hubert, Guilaume and Fraire, Juan and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Solenne and Baylac, Maud and Puchner, Helmut and Mecha, Hortensia and Velazco, Raoul (2018) SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2 MeV Neutrons. IEEE transactions on nuclear science (99). pp. 1-8. ISSN 0018-9499 (In Press)

Clemente Barreira, Juan Antonio and Hubert, Guillaume and Franco Peláez, Francisco Javier and Vila, Francesca and Baylac, Maud and Puchner, Helmut and Velazco, Raoul and Mecha López, Hortensia (2017) Sensitivity Characterization of a COTS 90-nm SRAM at Ultra Low Bias Voltage. IEEE transactions on nuclear science, 64 (8). pp. 2188-2195. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Ramos Vargas, Pablo Francisco and Vargas Vallejo, Vanessa Carolina and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Velazco, Raoul (2016) Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons. IEEE Transactions on Nuclear Science, 63 (4). pp. 2072-2079. ISSN 0018-9499

Velazco, Raoul and Franco Peláez, Francisco Javier (2007) Single event effects on digital integrated circuits: origins and mitigation techniques. In 2007 IEEE International Symposium on Industrial Electronics. IEEE, Piscataway, pp. 3322-3327. ISBN 978-1-4244-0755-2 (E-ISBN) ; 978-1-4244-0754-5 (Print ISBN)

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Baylac, Maud and Rey, Solenne and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2016) Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs. IEEE Transactions on Nuclear Science, 63 (4). pp. 2087-2094. ISSN 0018-9499

Franco Peláez, Francisco Javier and Clemente Barreira, Juan Antonio and Baylac, Maud and Rey, Solenne and Villa, Francesca and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2017) Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs. IEEE Transactions on Nuclear Science, 64 (8). pp. 2152-2160. ISSN 0018-9499

Clemente Barreira, Juan Antonio and Franco Peláez, Francisco Javier and Villa, Francesca and Rey, Sole and Baylac, Maud and Mecha López, Hortensia and Agapito Serrano, Juan Andrés and Puchner, Helmut and Hubert, Guillaume and Velazco, Raoul (2015) Statistical anomalies of bitflips in SRAMs to discriminate MCUs from SEUs. In 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2015. IEEE-Inst Electrical Electronics Engineers Inc, pp. 507-510. ISBN 978-1-5090-0232-0

This list was generated on Wed Nov 13 22:16:17 2019 CET.