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Nogales Díaz, Emilio and Martin, R. V. and O'Donnell, K. P. and Lorenz, K. and Alves, E. and Ruffenach, S. and Briot, O. (2006) Failure mechanism of AlN nanocaps used to protect rare earth-implanted GaN during high temperature annealing. Applied physics letters, 8 (3). ISSN 0003-6951

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